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Seminar paper
Paper title (chapter)Classification Framework for Nailfold Capillary Microscopy Images
Name of conferenceIEEE TENCON'2007
Name of author (Chinese)Chia-Hsien Wen
Name of author (English)Chia-Hsien Wen
AuthorsChia-Hsien Wen, Wei-Duen Liao, Kuan-Ching Li
LocationTaipei
Language used 
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